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Nondestructive Testing of Materials and Structures
by Büyüköztürk, Oral.
Publication:
. XXIX, 1278 p. 776 illus., 370 illus. in color.
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Ellipsometry at the Nanoscale
by Losurdo, Maria.
Publication:
. XXIV, 730 p. 423 illus., 106 illus. in color.
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Micro Metal Forming
by Vollertsen, Frank.
Publication:
. XIV, 437 p. 327 illus., 74 illus. in color.
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Terminal Ballistics
by Rosenberg, Zvi.
Publication:
. XIII, 323 p. 237 illus., 5 illus. in color.
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Fundamentals of Mass Determination
by Borys, Michael.
Publication:
. IX, 114p.
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Optical Measurements, Modeling, and Metrology, Volume 5
by Proulx, Tom.
Publication:
. X, 422 p.
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Thermomechanics and Infra-Red Imaging, Volume 7
by Proulx, Tom.
Publication:
. VIII, 132 p.
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Nanoindentation
by Fischer-Cripps, Anthony C.
Publication:
. XXII, 282 p.
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Springer Handbook of Metrology and Testing
by Czichos, Horst.
Publication:
. 1500p. 500 illus. in color.
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Optical Measurement of Surface Topography
by Leach, Richard.
Publication:
. XIV, 326p. 231 illus., 42 illus. in color.
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New Horizons of Applied Scanning Electron Microscopy
by Shimizu, Kenichi.
Publication:
. XIV, 182p. 102 illus., 25 illus. in color.
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Nanotechnology Standards
by Murashov, Vladimir.
Publication:
. XIV, 262 p.
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Semiconductor Research
by Patane, Amalia.
Publication:
. XIX, 372p. 192 illus., 38 illus. in color.
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Units of Measurement
by Gupta, S. V.
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